Description
The design of the alpha300 S Scanning Near-field Optical Microscope features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM.
For scanning near-field optical microscopy, the alpha300 S uses unique and patented micro-fabricated Cantilever SNOM-sensors that significantly outperform standard fiber optic probes in resolution, transmission, ease of operation and reliability.
The cantilever, employing the well established beam deflection principle for distance control, features a hollow pyramid with an aperture at its apex. This allows topography and optical images to be acquired simultaneously.